ENBIS-12 in Ljubljana

9 – 13 September 2012 Abstract submission: 15 January – 10 May 2012

Process and Control

12 September 2012, 09:45 – 11:15

Robust Control Chart to Monitor the Information System of Semiconductor Production Plant
09:45 – 10:05 Michel Lutz (Ecole des Mines de Saint-Etienne), Espéran Padonou (Ecole des Mines de Saint-Etienne), Olivier Roustant (Ecole des Mines de Saint-Etienne)

Detection of Abrupt Changes in Count Data Time Series: Cumulative Sum Derivations for INARCH(1) Models
10:05 – 10:25 Christian H. Weiß (Darmstadt University of Technology), Murat Caner Testik (Hacettepe University)

Imputation Methods in the Estimation of ARMA Models with Missing Observations
10:25 – 10:45 Korneel Bernaert (Vrije Universiteit Brussel)

An Overview of Bayesian Networks for Dynamic System Analysis and Control
10:45 – 11:05 Michael Ashcroft (Uppsala University)

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