ENBIS-13 in Ankara

15 – 19 September 2013 Abstract submission: 5 February – 5 June 2013

Contributed Session: Advances in Statistical Process Control

17 September 2013, 17:30 – 18:30

Assessing Spatial Patterns of Defectivity on Semiconductor Wafers: An Approach Based on the Minimum Spanning Tree Algorithm
17:30 – 17:50 Riccardo Borgoni (University of Milano Bicocca), Gabriele Arici (University of Milano Bicocca)

A Framework for Run-to-Run Process Control on a High-Mixed Semiconductor Manufacturing Process
17:50 – 18:10 Shui-Pin Lee (Department of Industrial Management, Chien Hsin University of Science and Technology)

Improving Shewhart-type Control Charts for Monitoring Multivariate Gaussian Process Variability: A Unified View from Generalized Variance to Log-likelihood Ratio Statistics
18:10 – 18:30 Emanuel Pimentel Barbosa (State University of Campinas - UNICAMP), Mario Antonio Gneri (State University of Campinas - UNICAMP), Ariane Meneguetti (State University of Campinas - UNICAMP)

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