ENBIS: European Network for Business and Industrial Statistics

Sequential Outlier Detection to Reveal Risk Devices in Semiconductor Industry

15:35 – 15:55 Anja Zernig (KAI - Kompetenzzentrum für Automobil- und Industrieelektronik GmbH), Olivia Bluder (KAI - Kompetenzzentrum für Automobil- und Industrieelektronik GmbH), Jürgen Pilz (Alpen-Adria Universität Klagenfurt), Andre Kästner (Infineon Technologies Austria AG)

A Simulation Approach of Experimental Design for Concrete Compressive Strength

15:55 – 16:15 Alexios E. Tamparopoulos (University of Natural Resources and Life Sciences, Vienna), Roman Wendner (University of Natural Resources and Life Sciences, Vienna)

A New Model for Duration and Segmentation of Maintenance Activities in Semiconductor Fabs

16:15 – 16:35 Diamanta Benson-Karhi (The Open University of Israel), Itai Regev (Intel)