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ENBIS-15 in Prague

6 – 10 September 2015; Prague, Czech Republic Abstract submission: 1 February – 3 July 2015

Contributed Session: Reliability 4

8 September 2015, 15:35 – 16:35

Sequential Outlier Detection to Reveal Risk Devices in Semiconductor Industry
15:35 – 15:55 Anja Zernig (KAI - Kompetenzzentrum für Automobil- und Industrieelektronik GmbH), Olivia Bluder (KAI - Kompetenzzentrum für Automobil- und Industrieelektronik GmbH), Jürgen Pilz (Alpen-Adria Universität Klagenfurt), Andre Kästner (Infineon Technologies Austria AG)

A Simulation Approach of Experimental Design for Concrete Compressive Strength
15:55 – 16:15 Alexios E. Tamparopoulos (University of Natural Resources and Life Sciences, Vienna), Roman Wendner (University of Natural Resources and Life Sciences, Vienna)

A New Model for Duration and Segmentation of Maintenance Activities in Semiconductor Fabs
16:15 – 16:35 Diamanta Benson-Karhi (The Open University of Israel), Itai Regev (Intel)

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