ENBIS: European Network for Business and Industrial Statistics

ENBIS – the European Network for Business and Industrial Statistics – is a platform where statistical practitioners and academic statisticians from Europe and beyond meet, exchange ideas and design new projects. ENBIS sponsors an annual conference and numerous additional events, many of them web-based.

The annual conference takes place every September and features presentations from a wide variety of sectors, ranging from manufacturing to service, from private to public sector. The ENBIS-16 conference will be held on 11-15 September 2016 in Sheffield (United Kingdom). The conference booklet containing the programme and abstracts will be published before the conference and inserted in delegates' packs. A special number of Quality and Reliability Engineering International (QREI) featuring selected papers presented in ENBIS-16 will be published in 2017 following a special post-conference Call for Papers to the conference participants and the wider ENBIS community.

The ENBIS-16 Programme Committee members are:

• Grazia Vicario, Politecnico di Torino, Italy (Chair).
• Jacqueline Asscher, Kinneret College, Israel.
• Alessandro di Bucchianico, Eindhoven University of Technology, The Netherlands.
• Shirley Coleman, Newcastle University, United Kingdom.
• Alastair Forbes, National Physical Laboratory, United Kingdom.
• Bart De Ketelaere, KU Leuven, Belgium.
• Rainer Göb, University of Würzburg, Germany.
• Ron Kenett, KPA Group, Israel.
• Kristina Lurz, prognostica GmbH, Germany.
• Irena Ograjenšek, University of Ljubljana, Slovenia.
• Biagio Palumbo, Università degli Studi di Napoli Federico II, Italy.
• Antonio Pievatolo, CNR-IMATI, Italy.
• Jean-Michel Poggi, Université Paris-Sud, France.
• Marco Seabra dos Reis, University of Coimbra, Portugal.
• Eleanor Stillman, University of Sheffield, United Kingdom.
• Kostas Triantafyllopoulos, University of Sheffield, United Kingdom.

 The ENBIS-16 Organizing Committee members are:

• Eleanor Stillman, University of Sheffield, United Kingdom (Chair).
• Kostas Triantafyllopoulos, University of Sheffield, United Kingdom.
• Jens Bischoff, University of Würzburg, Germany.
• Alessandro Di Bucchianico, Eindhoven University of Technology, The Netherlands.
• Rainer Göb, University of Würzburg, Germany.
• Kristina Lurz, prognostica GmbH, Germany.
• Irena Ograjenšek, University of Ljubljana, Slovenia.
• Antonio Pievatolo, CNR-IMATI, Italy.
• Marco Seabra dos Reis, University of Coimbra, Portugal.

A number of distinguished keynote speakers will give plenary talks at ENBIS-16. The list includes Stephen E. Fienberg (Carnegie Mellon University, USA), David J. Hand (Imperial College London, UK; the 2016 Box Medallist) and Neil D. Lawrence (University of Sheffield, UK).

The conference programme further includes invited and contributed sessions, workshops and panel discussions.

Pre-conference workshops, a post-conference course as well as the industrial heritage visit are to be booked separately from the main event. The confirmed list includes:

• A full-day pre-conference workshop on Sunday, September 11th, 2016 on Introduction to Kriging using R and JMP given by Nicolas Durrande and Volker Kraft.
• A half-day pre-conference workshop on Sunday, September 11th, 2016 on Organisational & Individual Certification of Competence Under The New ISO18404:2015 Standard on Six Sigma and Lean given by Tony Bendell.
• A post-conference industrial heritage visit to Cromford Mill on Wednesday, September 14th, 2016.
• A free half-day post-conference course on Thursday, September 15th, 2016 on Sensitivity Analysis for Computer Models given by Jeremy Oakley and Mark Strong.

Contributions to ENBIS-16 take the form of presentations, which can consist of advances in scientific research, overviews and introductions (presenting an area of expertise to the uninitiated), and best practice examples (sharing experiences of practitioners). The deadline for abstract submissions is June 20th, 2016.

Session topics include but are not limited to the following areas: