ENBIS-16 in Sheffield11 – 15 September 2016; Sheffield Abstract submission: 20 March – 4 July 2016
Invited Session: Software Session12 September 2016, 14:00 – 15:30
Ian Cox (Marketing Manager Europe, SAS Institute/JMP Division)
Quality control and improvement activities rely on correctly understanding sources of variation. Many products have an intrinsic two dimensional structure (semiconductor wafers, plastic mouldings, assay plates and so on), and quality characteristics are usually measured at multiple locations across this surface. Using JMP and some real case histories, this presentation shows how you can quickly and easily explore and present the important sources of spatial variation.