ENBIS-17 in Naples

9 – 14 September 2017; Naples (Italy) Abstract submission: 21 November 2016 – 10 May 2017

The Use of Attribute Charts to Monitor the Process Mean

11 September 2017, 17:50 – 18:10

Abstract

Submitted by
Linda Ho
Authors
Linda Ho (University of São Paulo)
Abstract
To monitor a process mean, usually the traditional Shewhart X-bar chart has been considered and in this case, the measures of the quality characteristic of the sample items need to be taken. It is well known that precise measurements of a quality characteristic are expensive and time-consuming and require the calibration of instruments; in destructive experiments, the sampled units are damaged and must be discarded. In these cases, an alternative is the classification of each sampled unit into a group using a device such as gauge rings. Operationally, this method is faster, and no measurement is taken on the sampled unit.
The aim of this research is to provide an overview of the recent attribute control charts proposed to monitor the process mean based on the results of the classification showing that it is possible to design attribute charts to have good performance economically and in terms of ARL1 like the traditional Shewhart X-bar chart.

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